Title :
RF magnetic emission and electrical coupling in silicon integrated circuits
Author :
Gutierrez-D, Edmundo A. ; Garcia-R, Pedro
Author_Institution :
Dept. of Electron., INAOE, Puebla
Abstract :
This paper introduces an analysis of electromagnetic radiation originated from interconnection lines of integrated circuits (IC). The impact of the signal frequency, the bias conditions, and the geometry and layout of the interconnection structure is also addressed. This analysis is used to understand the potential RF interference that may be caused by this emission, and also to predict on-chip signal integrity and coupling.
Keywords :
coupled circuits; electromagnetic waves; geometry; integrated circuit interconnections; integrated circuit layout; monolithic integrated circuits; system-on-chip; RF interference; RF magnetic emission; electrical coupling; electromagnetic radiation; geometry; integrated circuit interconnection lines; interconnection structure layout; on-chip signal integrity; signal coupling; signal frequency; silicon integrated circuit; Coupling circuits; Electromagnetic analysis; Electromagnetic radiation; Geometry; Integrated circuit interconnections; Magnetic analysis; Radio frequency; Radiofrequency integrated circuits; Signal analysis; Silicon;
Conference_Titel :
Devices, Circuits and Systems, 2008. ICCDCS 2008. 7th International Caribbean Conference on
Conference_Location :
Cancun
Print_ISBN :
978-1-4244-1956-2
Electronic_ISBN :
978-1-4244-1957-9
DOI :
10.1109/ICCDCS.2008.4542663
