DocumentCode
1858895
Title
Mechanical and electrical properties evaluation of carbon nanowire using electrostatic actuated nano tensile testing devices (EANAT)
Author
Kiuchi, Mario ; Isono, Yoshitada ; Sugiyama, Susumu ; Morita, Takahiro ; Matsui, Shinji
Author_Institution
Graduate Sch. of Sci. & Eng., Ritsumeikan Univ., Shiga, Japan
fYear
2005
fDate
11-15 July 2005
Firstpage
486
Abstract
This research develops electrostatic actuated nano tensile testing devices named EANAT to evaluate mechanical and electrical properties of carbon nanowire fabricated by focus ion beam assisted chemical vapor deposition (FIB-CVD). Carbon nano structures are one of promising nanomaterials used for NEMS. This research carried out nanoscale uniaxial tensile test and I-V characteristics measurement of 85 nm-diametric carbon nanowire using EANAT. Young´s modulus of carbon nanowires averaged 80 GPa, which is close to reported values of ultra-thin diamond-like carbon films. The tensile strength of nanowires was also 6 GPa in average. The electrical resistivity is about 0.015 Ωm.
Keywords
Young´s modulus; carbon; electrical resistivity; electrostatic actuators; nanowires; tensile strength; tensile testing; 0.015 ohmm; 85 nm; C; I-V characteristics; NEMS; Young modulus; carbon nanostructures; carbon nanowire; electrical properties; electrical resistivity; electrostatic actuated nano tensile testing devices; focus ion beam assisted chemical vapor deposition; mechanical properties; nanomaterials; nanoscale uniaxial tensile test; tensile strength; ultra-thin diamond-like carbon films; Chemical vapor deposition; Diamond-like carbon; Electric resistance; Electrostatic measurements; Ion beams; Mechanical factors; Nanoelectromechanical systems; Nanomaterials; Nanoscale devices; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Nanotechnology, 2005. 5th IEEE Conference on
Print_ISBN
0-7803-9199-3
Type
conf
DOI
10.1109/NANO.2005.1500806
Filename
1500806
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