DocumentCode
1859409
Title
Forming low resistance nano-scale contacts using solder reflow
Author
Ye, Hongke ; Gu, Zhiyong ; Yu, Thomas ; Bernfeld, Adam ; Leong, Timothy ; Gracias, David H.
Author_Institution
Dept. of Chem. & Biomolecular Eng., Johns Hopkins Univ., Baltimore, MD, USA
fYear
2005
fDate
11-15 July 2005
Firstpage
561
Abstract
We describe the use of solder reflow on the 100 nanometer scale to form electrically conductive contacts. We fabricated nanowires using electrodeposition in nanoporous templates. We investigated the use of directed assembly and nanoscale soldering to integrate the nanowires with microfabricated bond pads, and measured the electrical characteristics of the soldered wires. The electrical resistance of a single nanowire on top of two adjacent contact pads dropped by an order of magnitude after solder reflow. The results in this paper demonstrate that it is possible to use solder films as thin as 100 nm to electrically bond nanocomponents to substrates with contact resistances as low as 5 Ω.
Keywords
contact resistance; electrical resistivity; electrodeposition; nanocontacts; nanowires; reflow soldering; 100 nm; 5 ohm; contact resistance; directed assembly; electrical characteristics; electrical resistance; electrically bond nanocomponents; electrically conductive contacts; electrodeposition; low resistance nanoscale contacts; microfabricated bond pads; nanoporous templates; nanoscale soldering; nanowires; solder films; solder reflow; Assembly; Bonding; Contact resistance; Electric resistance; Electric variables; Electric variables measurement; Electrical resistance measurement; Nanoporous materials; Nanowires; Soldering;
fLanguage
English
Publisher
ieee
Conference_Titel
Nanotechnology, 2005. 5th IEEE Conference on
Print_ISBN
0-7803-9199-3
Type
conf
DOI
10.1109/NANO.2005.1500826
Filename
1500826
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