Title :
How to flip a bit?
Author :
Agoyan, Michel ; Dutertre, Jean-Max ; Mirbaha, Amir-Pasha ; Naccache, David ; Ribotta, Anne-Lise ; Tria, Assia
Author_Institution :
Dept. Syst. et Archit. Securisees (SAS), CEA-LETI, Gardanne, France
Abstract :
This note describes laser fault experiments on an 8-bit 0.35μm microcontroller with no countermeasures. We show that reproducible single-bit faults, often considered unfeasible, can be obtained by careful beam-size and shot-instant tuning.
Keywords :
fault diagnosis; microcontrollers; beam size; laser fault experiments; microcontroller; shot-instant tuning; single-bit faults; Circuit faults; Cryptography; Doped fiber amplifiers; Laser beams; Laser tuning; Random access memory;
Conference_Titel :
On-Line Testing Symposium (IOLTS), 2010 IEEE 16th International
Conference_Location :
Corfu
Print_ISBN :
978-1-4244-7724-1
DOI :
10.1109/IOLTS.2010.5560194
