Title :
Key randomization using a power analysis resistant deterministic random bit generator
Author :
Duplys, P. ; Böhl, E. ; Rosenstiel, W.
Abstract :
Hardware as well as software implementations of cryptographic algorithms are susceptible to power analysis attacks. Power analysis attacks exploit the dependence of the power consumption of a CMOS circuit on the data the circuit processes. We propose a power analysis-resistant deterministic random bit generator that operates on internal states with constant Hamming distance and Hamming weight.
Keywords :
CMOS integrated circuits; information theory; public key cryptography; CMOS circuit; Hamming distance; Hamming weight; cryptographic algorithms; deterministic random bit generator; key randomization; power analysis attacks; Cryptography; Generators; Hamming distance; Hamming weight; Latches; Polynomials; Power demand; NLMISR; Side channel attacks; power analysis;
Conference_Titel :
On-Line Testing Symposium (IOLTS), 2010 IEEE 16th International
Conference_Location :
Corfu
Print_ISBN :
978-1-4244-7724-1
DOI :
10.1109/IOLTS.2010.5560197