DocumentCode :
1859981
Title :
Implementing a cots design approach to reduce development time of complex microwave test adapters
Author :
Najle, Esteban ; Sarfi, Tom
Author_Institution :
BAE Syst., UK
fYear :
2012
fDate :
10-13 Sept. 2012
Firstpage :
75
Lastpage :
79
Abstract :
Large mil/aero prime contractors have been tasked to design and develop Radio Frequency (RF) and Microwave test systems with increasing pressure to deliver against very aggressive schedules. These systems are often quite complex and can include specifications and requirements that are classified, requiring design engineers to have appropriate security clearances. Rapid design cycles are needed to meet aggressive schedules and primes are encouraged to use as much Commercial-Off-The-Shelf (COTS) equipment as possible to facilitate manufacturability and contain non-recurring development costs to a minimum. In the RF/microwave domain, the combination of classified information and custom requirements make it difficult to utilize a fully COTS solution, and this is particularly true with customized RF Interface Units (RFIUs). In recent years, commercially available design tools have been introduced to the instrumentation market and primes have taken advantage of these tools to accelerate development and manufacturability of custom RFIUs. This paper discusses a solution that BAE Systems engineers architected using COTS-based command and control components from VTI Instruments. This result was a common Internal Integrated RF Interface System (Internal IRIS) capable of providing automated multiplexing, conditioning, and control of multiple RF signals to support independent RF signal channels for use in six unique Interface Test Adapters (ITAs).
Keywords :
automatic test equipment; military equipment; radio equipment; signal conditioning circuits; BAE system; COTS equipment design approach; Internal IRIS; RF signal channel; RF signal conditioning; RFIU; VTI instrument; automated multiplexing; command and control component; commercial-off-the-shelf; complex microwave test adapter; custom requirement; design tool; instrumentation market; integrated RF interface system; interface test adapter; manufacturability; microwave test system; radio frequency test system; security clearance; Assembly; Instruments; Iris; Iris recognition; Power cables; Radio frequency; Relays;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON, 2012 IEEE
Conference_Location :
Anaheim, CA
ISSN :
1088-7725
Print_ISBN :
978-1-4673-0698-0
Type :
conf
DOI :
10.1109/AUTEST.2012.6334566
Filename :
6334566
Link To Document :
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