• DocumentCode
    186006
  • Title

    Multimode characteristics of high-frequency CMOS-MEMS resonators

  • Author

    Jaesung Lee ; Cheng-Syun Li ; Ming-Huang Li ; Chi-Hang Chin ; Sheng-Shian Li ; Feng, Philip X.-L

  • Author_Institution
    Case Sch. of Eng., Case Western Reserve Univ., Cleveland, OH, USA
  • fYear
    2014
  • fDate
    19-22 May 2014
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    Multimode resonators offer new opportunities for resonant sensing with multimodality and enhanced degrees of freedom. This digest paper presents experimental measurements of multimode resonances in `dog-bone´-shaped resonators made by Si CMOS-MEMS processes. We have measured >18 modes which include both out-of-plane and in-plane resonances. We compare multimode results from both photo-thermal and capacitive actuations. We show that photo-thermal scheme can simultaneously excite many more modes, while capacitive actuation is more selective in modes and only efficiently couple to certain in-plane modes. The discovery of the many modes in these CMOS-MEMS resonators opens new possibilities for exploiting such devices for multimode resonant sensing, and for exploring coupling effects and spurious mode suppression techniques.
  • Keywords
    CMOS integrated circuits; elemental semiconductors; micromechanical resonators; microsensors; silicon; Si; capacitive actuation; coupling effect; degrees of freedom; dog-bone-shaped resonator; high-frequency CMOS-MEMS resonator; in-plane resonance; multimode resonance; multimode resonant sensor; multimode resonators characteristics; out-of-plane resonance; photothermal scheme; spurious mode suppression technique; Laser excitation; Laser modes; Measurement by laser beam; Optical interferometry; Optical resonators; Optical sensors; Optical variables measurement; CMOS-MEMS resonator; bulk-mode resonator; knife-edge technique; multimode; optical interferometry;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Frequency Control Symposium (FCS), 2014 IEEE International
  • Conference_Location
    Taipei
  • Type

    conf

  • DOI
    10.1109/FCS.2014.6859975
  • Filename
    6859975