DocumentCode :
1860631
Title :
Resolution in near-field optical interactions involving bare tapered optical fibers
Author :
Davis, C.C.
Author_Institution :
Dept. of Electr. Eng., Maryland Univ., College Park, MD, USA
fYear :
1999
fDate :
28-28 May 1999
Firstpage :
22
Abstract :
Summary form only given. The resolution achievable in near-field scanning optical microscopy (NSOM) with an uncoated fiber used in a conventional collection mode is not significantly below the diffraction limit. The resolution in reflection mode is better because of an equivalent "confocal" advantage. This mode of operation is analyzed using a Huygenian secondary source model with an inverse power law for re-collection of the light that has interacted with a sample. It is shown that in reflection mode a vibrating tip technique can produce an enhancement of the resolution as originally suggested by Buckland et al. Ultimately, as the tip diameter is reduced, the field is expelled from the fiber and insufficient energy remains guided within the fiber to permit further resolution enhancement.
Keywords :
image resolution; light reflection; near-field scanning optical microscopy; optical fibres; Huygenian secondary source model; bare tapered optical fibers; conventional collection mode; diffraction limit; equivalent confocal advantage; inverse power law; light re-collection; near-field optical interactions; near-field scanning optical microscopy; operation mode; reflection mode; resolution; resolution enhancement; tip diameter; uncoated fiber; vibrating tip technique; Educational institutions; Energy resolution; Geometry; Inverse problems; Optical diffraction; Optical fibers; Optical microscopy; Optical reflection; Shape; Spatial resolution;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics, 1999. CLEO '99. Summaries of Papers Presented at the Conference on
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
1-55752-595-1
Type :
conf
DOI :
10.1109/CLEO.1999.833823
Filename :
833823
Link To Document :
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