DocumentCode
1860752
Title
[Front matter]
fYear
2010
fDate
5-7 July 2010
Abstract
The following topics are dealt with: degradation modeling and monitoring; transients analysis and evaluation; multicore/manycore on-line testing; fault tolerance in 3D ICs and FPGAs; memory test, repair, and fault tolerance; soft and timing error tolerance; analog and mixed-signal circuit testing; reliability.
Keywords
analogue integrated circuits; fault tolerance; field programmable gate arrays; integrated circuit testing; microprocessor chips; mixed analogue-digital integrated circuits; three-dimensional integrated circuits; transient analysis; 3D integrated circuits; analog circuit testing; degradation modeling; degradation monitoring; fault tolerance; field programmable gate arrays; memory test; mixed-signal circuit testing; muiticore on-line testing; reliability; soft error tolerance; timing error tolerance; transients analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
On-Line Testing Symposium (IOLTS), 2010 IEEE 16th International
Conference_Location
Corfu
Print_ISBN
978-1-4244-7724-1
Type
conf
DOI
10.1109/IOLTS.2010.5560244
Filename
5560244
Link To Document