Title :
Measurement of power delivery system impedance, current and switching activity on functioning die
Author :
Kantorovich, I. ; Drabkin, Victor ; Houghton, C. ; St Laurent, J.
Author_Institution :
Intel Corp., Hudson, MA, USA
Abstract :
Power delivery system (PDS) noise, current and impedance are major indicators of chip performance. The paper considers an approach in which on-chip impedance measurement is conducted for controlled periodic step-wise computer process. The main difficulty of the approach is current reconstruction. Current can be obtained from measured equivalent conductance of the chip, which can serve as a quantification of chip activity.
Keywords :
electric admittance measurement; electric current measurement; electric impedance measurement; integrated circuit noise; power supply circuits; chip activity quantification; chip performance; circuit noise; current measurement; current reconstruction; equivalent conductance measurement; functioning die; impedance measurement; power delivery system; step-wise computer process; switching activity; Clocks; Current measurement; Frequency; Impedance measurement; Packaging; Performance evaluation; Power measurement; Semiconductor device measurement; Silicon; Voltage;
Conference_Titel :
Signal Propagation on Interconnects, 2005. Proceedings. 9th IEEE Workshop on
Print_ISBN :
0-7803-9054-7
DOI :
10.1109/SPI.2005.1500888
