DocumentCode :
1861687
Title :
Fault analysis of advanced series compensated line using S-transform and pattern recognition approach
Author :
Dash, P.K. ; Samantaray, S.R. ; Panda, G.
Author_Institution :
College of Eng., Bhubaneshwar
fYear :
2005
fDate :
Nov. 29 2005-Dec. 2 2005
Firstpage :
1
Lastpage :
484
Abstract :
The S-transform (ST) is an extension of wavelet transform which possesses superior property over the latter as the moving functions are fixed with respect to time axis while the localizing scalable Gaussian window dilates and translates. Phase spectrum obtained in this transform is always with respect to fixed reference point and the real and imaginary spectrum can be localized independently. Such a transform with moving and scalable localizing Gaussian window, therefore, provides excellent time localization property for different signals. Utilizing the ST fault current signal is analyzed for an advanced series compensated transmission system. The spectral analysis of the current signals at different fault conditions of the system clearly classifies the faulty phase and faulty section
Keywords :
fault location; flexible AC transmission systems; pattern recognition; power transmission faults; spectral analysis; wavelet transforms; Phase spectrum; S-transform; advanced series compensated line; advanced series compensated transmission system; fault analysis; fault current signal; pattern recognition; scalable localizing Gaussian window; spectral analysis; wavelet transform; Neural networks; Pattern analysis; Pattern recognition; Power system protection; Power system transients; Power transmission lines; Signal analysis; Transient analysis; Wavelet analysis; Wavelet transforms; Advanced series compensation; FACTS; S-transform; Wavelet transform; fault analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Engineering Conference, 2005. IPEC 2005. The 7th International
Conference_Location :
Singapore
Print_ISBN :
981-05-5702-7
Type :
conf
DOI :
10.1109/IPEC.2005.206956
Filename :
1627245
Link To Document :
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