Title :
Wide bandgap semiconductor electronic devices for high frequency applications
Author :
Trew, R.J. ; Shin, M.W. ; Gatto, V.
Author_Institution :
Dept. of Electr. Eng. & Appl. Phys., Case Western Reserve Univ., Cleveland, OH, USA
Abstract :
The microwave performance of electronic devices fabricated from SiC and GaN is described. The investigation makes use of theoretical simulations and the results are compared to experimental measurements. Excellent agreement between the simulated and measured data is obtained. It is demonstrated that microwave power amplifiers fabricated from SiC and GaN based semiconductors offer superior RF power performance, particularly at elevated temperature compared to comparable components fabricated from GaAs MESFET´s. In particular, room temperature RF output power on the order of 4 W/mm with power-added efficiency approaching the ideal values for class A and B operation is available. These devices are likely to find application in power amplifiers for base station transmitters for cellular telephone systems, power modules for phased-array radars, and other applications. The devices are particularly attractive for applications that require operation at elevated temperature.
Keywords :
III-V semiconductors; gallium compounds; microwave field effect transistors; microwave power amplifiers; silicon compounds; wide band gap semiconductors; GaN; RF power; SiC; base station transmitter; cellular telephone system; class A operation; class B operation; elevated temperature; high frequency applications; microwave power amplifier; phased-array radar; power module; power-added efficiency; wide bandgap semiconductor electronic device; Gallium nitride; Microwave amplifiers; Microwave devices; Power amplifiers; Radio frequency; Radiofrequency amplifiers; Semiconductor optical amplifiers; Silicon carbide; Temperature; Wide band gap semiconductors;
Conference_Titel :
Gallium Arsenide Integrated Circuit (GaAs IC) Symposium, 1996. Technical Digest 1996., 18th Annual
Conference_Location :
Orlando, FL, USA
Print_ISBN :
0-7803-3504-X
DOI :
10.1109/GAAS.1996.567625