• DocumentCode
    1862932
  • Title

    Perceptual soft thresholding using the structural similarity index

  • Author

    Channappayya, Sumohana S. ; Bovik, Alan C. ; Heath, Robert W., Jr.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Texas at Austin, Austin, TX
  • fYear
    2008
  • fDate
    12-15 Oct. 2008
  • Firstpage
    569
  • Lastpage
    572
  • Abstract
    In this paper, we present a novel algorithm for wavelet domain image denoising using the soft thresholding function. The thresholds are designed to be locally optimal with respect to the structural similarity (SSIM) index. The SSIM Index is first expressed in terms of wavelet transform coefficients of orthogonal wavelet transforms. The wavelet domain representation of the SSIM Index, along with the assumption of a Gaussian prior for the wavelet coefficients is used to formulate the soft thresholding optimization problem. A locally optimal solution is found using a quasi-Newton approach. This solution is applied to denoise images in the wavelet domain. The visual quality of the images denoised using the proposed algorithm is shown to be higher compared to the MSE-optimal soft thresholding denoising solution, as measured by the SSIM Index.
  • Keywords
    image denoising; wavelet transforms; MSE-optimal soft thresholding denoising; SSIM index; orthogonal wavelet transform; perceptual soft thresholding; quasiNewton approach; soft thresholding function; soft thresholding optimization; structural similarity index; visual quality; wavelet coefficients; wavelet domain image denoising; wavelet domain representation; wavelet transform coefficients; Distortion measurement; Heat engines; Image denoising; Image processing; Image quality; Noise reduction; Resistance heating; Wavelet coefficients; Wavelet domain; Wavelet transforms; Image denoising;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Image Processing, 2008. ICIP 2008. 15th IEEE International Conference on
  • Conference_Location
    San Diego, CA
  • ISSN
    1522-4880
  • Print_ISBN
    978-1-4244-1765-0
  • Electronic_ISBN
    1522-4880
  • Type

    conf

  • DOI
    10.1109/ICIP.2008.4711818
  • Filename
    4711818