Title :
Modulation transfer function (MTF) measurement of CdZnTe detectors for digital radiography and computed tomography
Author :
Giakos, G.C. ; Vedantham, S. ; Suryanarayanan, S. ; Chowdhury, S. ; Guntupalli, R. ; Odogba, J. ; Vega-Lozada, V. ; Pillai, B. ; Dasgupta, A.
Author_Institution :
Dept. of Biomed. Eng., Akron Univ., OH, USA
Abstract :
In this study, dependence of the temporal modulation of a Cd1-xZnxTe detector, operated under scanning beam geometry, of both the applied electric field and detector thickness, at each frequency of a scanning square-wave test pattern, have been measured. The experimental arrangement, although is not offered for large field-of-view imaging applications, offers potential capabilities for feasibility studies, research and evaluation of the temporal response and noise characteristics of a Cd1-xZnxTe detector, for fast digital radiographic and computed tomographic (CT) applications. The experimental results indicate a system spatial resolution of >8 cy/mm. Currently, efforts are aimed at improving the imaging potential of the experimental detector system, by optimizing system geometry as well as by increasing the temporal response of the overall system
Keywords :
II-VI semiconductors; X-ray detection; cadmium compounds; computerised tomography; diagnostic radiography; semiconductor counters; transfer functions; zinc compounds; CdZnTe; X-ray detectors; applied electric field; computed tomography; detector thickness; digital radiography; modulation transfer function; noise characteristics; scanning beam geometry; scanning square-wave test pattern; system spatial resolution; temporal modulation; Detectors; Electric variables measurement; Frequency measurement; Geometry; Optical modulation; Tellurium; Testing; Thickness measurement; Transfer functions; Zinc;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1998. IMTC/98. Conference Proceedings. IEEE
Conference_Location :
St. Paul, MN
Print_ISBN :
0-7803-4797-8
DOI :
10.1109/IMTC.1998.679828
