Characterization of transient error tolerance for a class of mobile embedded applications

Author

Liang Wang ; Bertran, Ramon ; Buyuktosunoglu, Alper ; Bose, Pradip ; Skadron, Kevin

Author_Institution

IBM T. J. Watson Res. Center, Univ. of Virginia, Charlottesville, VA, USA

fYear

2014

fDate

26-28 Oct. 2014

Firstpage

74

Lastpage

75

Abstract

We study the inherent resilience (to transient errors) of a class of embedded applications that are currently under study in the DARPA-sponsored program called PERFECT. The experimental setup used in this research uses a fast fault-injection methodology, that takes advantage of native execution speeds on actual system hardware. The reported resilience characterization data are interpreted in the context of measured workload metrics like dynamic instruction frequency mix.

Keywords

embedded systems; error handling; fault tolerant computing; mobile computing; DARPA-sponsored program; PERFECT; dynamic instruction frequency mix; fault-injection methodology; mobile embedded applications; resilience characterization data; system hardware; transient error tolerance; transient errors; workload metrics; Hardware; Mobile communication; Optimization; Registers; Resilience; Transient analysis; Vectors;

fLanguage

English

Publisher

ieee

Conference_Titel

Workload Characterization (IISWC), 2014 IEEE International Symposium on

Conference_Location

Raleigh, NC

Print_ISBN

978-1-4799-6452-9

Type

conf

DOI

10.1109/IISWC.2014.6983042

Filename

6983042