Title :
Characterization of transient error tolerance for a class of mobile embedded applications
Author :
Liang Wang ; Bertran, Ramon ; Buyuktosunoglu, Alper ; Bose, Pradip ; Skadron, Kevin
Author_Institution :
IBM T. J. Watson Res. Center, Univ. of Virginia, Charlottesville, VA, USA
Abstract :
We study the inherent resilience (to transient errors) of a class of embedded applications that are currently under study in the DARPA-sponsored program called PERFECT. The experimental setup used in this research uses a fast fault-injection methodology, that takes advantage of native execution speeds on actual system hardware. The reported resilience characterization data are interpreted in the context of measured workload metrics like dynamic instruction frequency mix.
Keywords :
embedded systems; error handling; fault tolerant computing; mobile computing; DARPA-sponsored program; PERFECT; dynamic instruction frequency mix; fault-injection methodology; mobile embedded applications; resilience characterization data; system hardware; transient error tolerance; transient errors; workload metrics; Hardware; Mobile communication; Optimization; Registers; Resilience; Transient analysis; Vectors;
Conference_Titel :
Workload Characterization (IISWC), 2014 IEEE International Symposium on
Conference_Location :
Raleigh, NC
Print_ISBN :
978-1-4799-6452-9
DOI :
10.1109/IISWC.2014.6983042
