Modeling and Simulation of Multi-operation Microcode-Based Built-In Self Test for Memory Faults

As embedded memory area on-chip is increasing and memory density is growing, problem of faults is growing exponentially. This necessitates defining of novel test algorithms which can detect these new faults. March Tests belong to the newer line of testing algorithms which offer to detect these exponentially escalating faults. Most of these new March algorithms consist of as many as five or six operations per March element. This work presents an architecture which can implement these new March tests having number of operations per element according to the growing needs of embedded memory testing.