Title :
A supervised nonlinear neighborhood embedding of color histogram for image indexing
Author :
Han, Xian-Hua ; Chen, Yen-wei ; Sukegawa, Takeshi
Author_Institution :
Electron. & Inf. Eng. Sch., Central South Univ. of Forestry & Technol., Changsha
Abstract :
Subspace learning techniques are widespread in pattern recognition research. They include PCA, ICA, LPP, etc. These techniques are generally linear and unsupervised. The problem of image indexing is very complicated and the processed images are usually lie on non-linear image subspaces. In this paper, we propose a supervised nonlinear neighborhood embedding algorithm which learns an adaptive nonlinear subspace by preserving the neighborhood structure of the image color space. In the proposed algorithm, we combine the idea of nonlinear kernel mapping and preserving the neighborhood structure of the samples, so it can not only gain a perfect approximation of the nonlinear image manifold, but also enhance within-class neighborhood information. Experimental results show that the proposed method outperform other linear or unsupervised subspace learning methods.
Keywords :
content-based retrieval; image colour analysis; image retrieval; learning (artificial intelligence); principal component analysis; adaptive nonlinear subspace; color histogram; content-based image retrieval; image color space; image indexing; neighborhood structure preservation; nonlinear kernel mapping; pattern recognition; principal component analysis; supervised nonlinear neighborhood embedding; unsupervised subspace learning; Content based retrieval; Histograms; Image databases; Image retrieval; Independent component analysis; Indexing; Information retrieval; Linear discriminant analysis; Principal component analysis; Spatial databases; Image retrieval; Locality Preserving Projection; subspace Learning; supervised nonlinear neighborhood embedding;
Conference_Titel :
Image Processing, 2008. ICIP 2008. 15th IEEE International Conference on
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4244-1765-0
Electronic_ISBN :
1522-4880
DOI :
10.1109/ICIP.2008.4711913