DocumentCode
1865174
Title
Alignment insensitive anisotropic etching of silicon cavities with smooth 49° sidewalls
Author
Shen, C. ; Pham, H.T.M. ; Sarro, P.M.
Author_Institution
DIMES-ECTM, Delft Univ. of Technol., Delft, Netherlands
fYear
2009
fDate
21-25 June 2009
Firstpage
1071
Lastpage
1074
Abstract
Anisotropic etchants like TMAH are used to etch cavities with smooth sidewalls in silicon wafers for MEMS applications. However, complicated crystalline alignment steps are usually needed as crystalline misalignment will enlarge and rotate the etched cavities in an unpredictable way. In this paper, we presented a simple process to avoid unexpected cavity distortion caused by minor crystalline misalignment in TMAH etch. Besides, this process also offers smooth and less inclined sidewalls with a non-standard angle of 49deg on {100} wafers.
Keywords
etching; micromechanical devices; silicon; MEMS applications; Si; TMAH etch; alignment insensitivity; anisotropic etching; sidewalls; silicon cavities; silicon wafers; Anisotropic magnetoresistance; Crystallization; Micromachining; Micromechanical devices; Optical distortion; Optical resonators; Optical sensors; Shape; Silicon; Sputter etching; Tetramethyl amrnonium hydroxide (TMAH); anisotropic etching; silicon bulk micromachining;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Sensors, Actuators and Microsystems Conference, 2009. TRANSDUCERS 2009. International
Conference_Location
Denver, CO
Print_ISBN
978-1-4244-4190-7
Electronic_ISBN
978-1-4244-4193-8
Type
conf
DOI
10.1109/SENSOR.2009.5285944
Filename
5285944
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