• DocumentCode
    1865174
  • Title

    Alignment insensitive anisotropic etching of silicon cavities with smooth 49° sidewalls

  • Author

    Shen, C. ; Pham, H.T.M. ; Sarro, P.M.

  • Author_Institution
    DIMES-ECTM, Delft Univ. of Technol., Delft, Netherlands
  • fYear
    2009
  • fDate
    21-25 June 2009
  • Firstpage
    1071
  • Lastpage
    1074
  • Abstract
    Anisotropic etchants like TMAH are used to etch cavities with smooth sidewalls in silicon wafers for MEMS applications. However, complicated crystalline alignment steps are usually needed as crystalline misalignment will enlarge and rotate the etched cavities in an unpredictable way. In this paper, we presented a simple process to avoid unexpected cavity distortion caused by minor crystalline misalignment in TMAH etch. Besides, this process also offers smooth and less inclined sidewalls with a non-standard angle of 49deg on {100} wafers.
  • Keywords
    etching; micromechanical devices; silicon; MEMS applications; Si; TMAH etch; alignment insensitivity; anisotropic etching; sidewalls; silicon cavities; silicon wafers; Anisotropic magnetoresistance; Crystallization; Micromachining; Micromechanical devices; Optical distortion; Optical resonators; Optical sensors; Shape; Silicon; Sputter etching; Tetramethyl amrnonium hydroxide (TMAH); anisotropic etching; silicon bulk micromachining;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Sensors, Actuators and Microsystems Conference, 2009. TRANSDUCERS 2009. International
  • Conference_Location
    Denver, CO
  • Print_ISBN
    978-1-4244-4190-7
  • Electronic_ISBN
    978-1-4244-4193-8
  • Type

    conf

  • DOI
    10.1109/SENSOR.2009.5285944
  • Filename
    5285944