• DocumentCode
    1865463
  • Title

    Nanoscale measurements of the surface photovoltage in Cu(In, Ga)Se2, Cu2ZnSnS4, and Cu2ZnSnSe4 thin films: The role of the surface electronics on the efficiency of solar cells

  • Author

    Du, H. ; Romero, M.J. ; Repins, I. ; Teeter, G. ; Noufi, R. ; Al-Jassim, M.M.

  • Author_Institution
    Nat. Renewable Energy Lab., Golden, CO, USA
  • fYear
    2011
  • fDate
    19-24 June 2011
  • Abstract
    We report on recent advances in the development of nanoscale measurements of the surface photovoltage (SPV) based on scanning tunneling microscopy (STM) and its application to the kesterites Cu2ZnSnS4 (CZTS) and Cu2ZnSnSe4 (CZTSe). One critical aspect of the electronic structure of Cu(In, Ga)Se2 (CIGS) that has yet to be determined in their related kesterite compounds is the character of the surface electronics. In CIGS, spontaneous deviations in the stoichiometry of the surface cause a depletion (or even a type inversion) region that reinforces the CIGS homojunction. First-principle calculations predict that this inversion region will be more difficult to form in CZTS. In this contribution, the characteristics of the surface space charge region for both CIGS and CZTS(e) are investigated by STM. The implications of the results of these measurements on the future development of CZTS solar cells will be discussed.
  • Keywords
    copper compounds; gallium compounds; indium compounds; scanning tunnelling spectroscopy; solar cells; space charge; stoichiometry; surface charging; thin films; tin compounds; voltage measurement; zinc compounds; Cu(InGa)Se2; Cu2ZnSnS4; Cu2ZnSnSe4; SPV nanoscale measurement; STM; first-principle calculation prediction; inversion region; kesterite compound; scanning tunneling microscopy; solar cell efficiency; surface electronic; surface photovoltage nanoscale measurement; surface space charge region; surface stoichiometry deviation; thin film; Copper; Films; Photoconductivity; Photovoltaic cells; Semiconductor device measurement; Tunneling; Voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE
  • Conference_Location
    Seattle, WA
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-9966-3
  • Type

    conf

  • DOI
    10.1109/PVSC.2011.6186342
  • Filename
    6186342