DocumentCode
1866554
Title
Effect of oxygen ambient during POCl3 diffusion on the performance of silicon solar cells
Author
Kumar, Dinesh ; Saravanan, S. ; Suratkar, Prakash
Author_Institution
Cell Technol. & Process Eng, TATA BP Solar India Ltd., Bangalore, India
fYear
2011
fDate
19-24 June 2011
Abstract
Phosphorous (P) diffusion is the most important and crucial process in the fabrication of silicon (Si) solar cells. P-diffusion using POCl3 in a tube furnace reveals the best cell performance because of uniform dopant concentration over the Si surface and gettering of impurities in the substrate. The emitter formation by P-diffusion using POCl3 diffusion source is a complex and advanced process which provides the gettering and forming the unwanted dead layer on the front surface due to inactive phosphorous. Along with temperature, the ambient conditions during the diffusion process, such as gas flow rates and their composition, flow kinetics also have an impact in the emitter properties. In the present paper, the impact of oxygen (O2) flow during the diffusion process has been studied. It has been found that, the presence of oxygen during the diffusion process influences the concentration of inactive phosphorous over the surface and the gettering process as well. The optimized flow of oxygen shows, an improvement in lifetime of ~ 24 μsec and an absolute efficiency gain of ~0.3%.
Keywords
doping profiles; elemental semiconductors; furnaces; getters; phosphorus compounds; reaction kinetics; silicon; solar cells; POCl3; Si; Si surface; dopant concentration; flow kinetics; impurity gettering; inactive phosphorous concentration; optimized flow; oxygen ambient effect; oxygen impact; oxygen shows; phosphorous diffusion; silicon solar cells; substrate; tube furnace; Contact resistance; Diffusion processes; Gettering; Photovoltaic cells; Resistance; Silicon; Surface treatment; Mono crystalline silicon solar cells; Oxygen flow rates; POCl3 diffusion;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE
Conference_Location
Seattle, WA
ISSN
0160-8371
Print_ISBN
978-1-4244-9966-3
Type
conf
DOI
10.1109/PVSC.2011.6186385
Filename
6186385
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