DocumentCode :
186694
Title :
Package reliability and performance trends in an era of product integration
Author :
Jun He
Author_Institution :
Intel Corp., Chandler, AZ, USA
fYear :
2014
fDate :
1-5 June 2014
Abstract :
Product differentiation is expected to accelerate and will encompass integration of product functionality into single and multiple die on package as well as multiple die/packages on board. Novel packaging designs will lead to incorporation of new materials and processes from which a comprehensive understanding of operating conditions at system and subcomponent level will be required to ensure reliability at minimum impact to cost & performance. Reliability tests, models and analysis must evolve to encompass emerging failure mechanisms and geometric effects not considered when standards were originally authored. This manuscript will show trends in packaging and materials along with examples of emerging failure mechanisms that need to be understood to ensure reliability in highly integrated products.
Keywords :
failure analysis; integrated circuit packaging; integrated circuit reliability; failure mechanisms; multiple die package; package reliability; product differentiation; product integration; reliability analysis; reliability model; reliability test; Failure analysis; Materials; Measurement; Packaging; Reliability; Standards; Stress; geometric scaling; knowledge based qualification; reliability modeling; system use conditions;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability Physics Symposium, 2014 IEEE International
Conference_Location :
Waikoloa, HI
Type :
conf
DOI :
10.1109/IRPS.2014.6860605
Filename :
6860605
Link To Document :
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