Title :
Characteristic improvement of inkjet printed Ag interconnects using tape on-off and mirror-reaction processes
Author :
Zi-Li Guo ; Yu-Min Fu ; Yu-Ting Cheng ; Bor-Yuan Shew ; Pu-Wei Wu
Author_Institution :
Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
fDate :
June 29 2015-July 2 2015
Abstract :
In the paper, we develop and implement the processes of tape on-off and Ag mirror-reaction to the previously developed size scalable inkjet printing process technique, i.e. CPLoP (Combined Process of Lift-off and Printing) for continuing its future interconnect applications in flexible microelectronics. The newly developed processes not only reduce coffee ring effect but also improve better electrical conductivity of the printed Ag interconnects at low process temperature. A 10μm wide Ag interconnect with flat surface morphology and low electrical resistivity, i.e. 7.7 μΩ · cm, has been realized.
Keywords :
electrical conductivity; flexible electronics; ink jet printing; metallisation; nanoparticles; silver; Ag; coffee ring effect; electrical conductivity; flat surface morphology; flexible microelectronics; inkjet printed interconnects; low electrical resistivity; mirror-reaction processes; tape on-off; Conductivity; Integrated circuit interconnections; Mirrors; Nanoparticles; Printing; Silver; Substrates;
Conference_Titel :
Physical and Failure Analysis of Integrated Circuits (IPFA), 2015 IEEE 22nd International Symposium on the
Conference_Location :
Hsinchu
DOI :
10.1109/IPFA.2015.7224328