Title :
Analysis of reliability/performance trade-off in Solid State Drives
Author :
Zuolo, Lorenzo ; Zambelli, Cristian ; Micheloni, Rino ; Bertozzi, Davide ; Olivo, Piero
Author_Institution :
Dipt. di Ing., Univ. di Ferrara, Ferrara, Italy
Abstract :
Flash-based Solid-State Drives (SSDs) are rapidly becoming the mainstream solution in the storage panorama thanks to their ruggedness, high performance and reliability. To guarantee the demanding reliability requirements, it is mandatory to embed complex Error Correction Codes (ECCs) and advanced read algorithms. These countermeasures induce an overall performance degradation and hence a non trivial reliability-performance trade-off arises. This work explores such trade-off in a qualitative manner.
Keywords :
error correction codes; error statistics; flash memories; integrated circuit reliability; error correction codes; solid state drives; Ash; Bit error rate; Engines; Error correction codes; Flash memories; Reliability; Threshold voltage;
Conference_Titel :
Reliability Physics Symposium, 2014 IEEE International
Conference_Location :
Waikoloa, HI
DOI :
10.1109/IRPS.2014.6860646
