DocumentCode :
1869167
Title :
High-efficiency L and S-band power amplifiers with high-breakdown GaAs-based pHEMTs
Author :
Pusl, J.A. ; Widman, R.D. ; Brown, J.J. ; Hu, M. ; Kaur, N. ; BeZaire, M. ; Nguyen, L.D.
Author_Institution :
Hughes Space & Commun. Co., Los Angeles, CA, USA
Volume :
2
fYear :
1998
fDate :
7-12 June 1998
Firstpage :
711
Abstract :
Performance and reliability data for harmonically-terminated, high-efficiency microwave power amplifiers designed from active harmonic loadpull data utilizing high breakdown voltage AlGaAs-InGaAs-GaAs pHEMTs are reported. Single stage MIC amplifiers fabricated with 2/spl times/25 mm gate width pHEMTs resulted in P/sub out/=20 W and PAE=66% at 1.5 GHz and 2.2 GHz. Balanced hybrid amplifiers with these modules have been fabricated which have P/sub out/=40 W and PAE=64%. To the authors knowledge, this is the highest combination of reliable output power and efficiency ever achieved with pHEMT devices. Single stage amplifiers fabricated with a single 5 mm or 10 mm pHEMT gave P/sub out/=2 W and 4 W, respectively, with PAE=72%. All of these output powers are at power densities of 0.4 W/mm. These devices have undergone DC and RF lifetests with good results. This GaAs-based pHEMT device technology supports amplifier module designs in the 1-20 GHz frequency range.
Keywords :
HEMT circuits; III-V semiconductors; UHF field effect transistors; UHF integrated circuits; UHF power amplifiers; electric breakdown; gallium arsenide; integrated circuit packaging; integrated circuit reliability; microwave field effect transistors; microwave integrated circuits; microwave power amplifiers; microwave power transistors; modules; power HEMT; semiconductor device reliability; 1 to 20 GHz; 2 to 40 W; 64 to 72 percent; AlGaAs-InGaAs-GaAs; L-band power amplifiers; S-band power amplifiers; SHF; UHF; active harmonic loadpull data; amplifier module designs; balanced hybrid amplifiers; breakdown voltage; harmonically-terminated configuration; high-breakdown GaAs-based pHEMTs; high-efficiency amplifiers; lifetests; microwave power amplifiers; reliability data; single stage MIC amplifiers; Gallium arsenide; High power amplifiers; Impedance; Molecular beam epitaxial growth; PHEMTs; Power measurement; Radio frequency; Radiofrequency amplifiers; Space technology; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 1998 IEEE MTT-S International
Conference_Location :
Baltimore, MD, USA
ISSN :
0149-645X
Print_ISBN :
0-7803-4471-5
Type :
conf
DOI :
10.1109/MWSYM.1998.705090
Filename :
705090
Link To Document :
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