DocumentCode
1869645
Title
Enhanced thermal management for future processors
Author
Ma, M. ; Gunther, S.H. ; Greiner, B. ; Wolff, N. ; Deutschle, C. ; Arabi, T.
fYear
2003
fDate
12-14 June 2003
Firstpage
201
Lastpage
204
Abstract
An enhanced thermal management mechanism that reduces power by scaling frequency and voltage in response to excessive temperatures is presented. The voltage transition process is done transparently to the execution of applications. The enhanced mechanism achieves an /spl sim/50% power reduction while limiting the performance impact to only /spl sim/20% for the duration of the thermal event. The approach allows the processor to meet its performance and reliability goals without additional thermal solution costs.
Keywords
reliability; temperature sensors; thermal management (packaging); enhanced thermal management; power reduction; processors; reliability; scaling frequency; transparent; voltage transition; Clocks; Costs; Energy consumption; Energy management; Frequency; Logic; Power generation; Temperature sensors; Thermal management; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Circuits, 2003. Digest of Technical Papers. 2003 Symposium on
Conference_Location
Kyoto, Japan
Print_ISBN
4-89114-034-8
Type
conf
DOI
10.1109/VLSIC.2003.1221202
Filename
1221202
Link To Document