• DocumentCode
    1869645
  • Title

    Enhanced thermal management for future processors

  • Author

    Ma, M. ; Gunther, S.H. ; Greiner, B. ; Wolff, N. ; Deutschle, C. ; Arabi, T.

  • fYear
    2003
  • fDate
    12-14 June 2003
  • Firstpage
    201
  • Lastpage
    204
  • Abstract
    An enhanced thermal management mechanism that reduces power by scaling frequency and voltage in response to excessive temperatures is presented. The voltage transition process is done transparently to the execution of applications. The enhanced mechanism achieves an /spl sim/50% power reduction while limiting the performance impact to only /spl sim/20% for the duration of the thermal event. The approach allows the processor to meet its performance and reliability goals without additional thermal solution costs.
  • Keywords
    reliability; temperature sensors; thermal management (packaging); enhanced thermal management; power reduction; processors; reliability; scaling frequency; transparent; voltage transition; Clocks; Costs; Energy consumption; Energy management; Frequency; Logic; Power generation; Temperature sensors; Thermal management; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Circuits, 2003. Digest of Technical Papers. 2003 Symposium on
  • Conference_Location
    Kyoto, Japan
  • Print_ISBN
    4-89114-034-8
  • Type

    conf

  • DOI
    10.1109/VLSIC.2003.1221202
  • Filename
    1221202