Title :
A novel sixport calibration incorporating diode detector non-linearity
Author :
Judah, S.R. ; Holmes, W.
Author_Institution :
Dept. of Electron. Eng., Hull Univ., UK
Abstract :
This paper describes a calibration technique for sixports which incorporates diode non-linearity as part of the calibration procedure of the sixport itself. The calibration is based on five unit reflection standards and relaxes the constraint that all the denominator constants of the bi-linear transform have to be the same. This is to first order, a consequence of the nonlinearity of the diodes
Keywords :
calibration; microwave reflectometry; nonlinear systems; optical delay lines; semiconductor diodes; bilinear transform; diode detector nonlinearity; reflection standards; reflectometers; six-port calibration; Bismuth; Calibration; Circuits; Diodes; Envelope detectors; Equations; Instruments; Phase measurement; Reflection; Testing;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1998. IMTC/98. Conference Proceedings. IEEE
Conference_Location :
St. Paul, MN
Print_ISBN :
0-7803-4797-8
DOI :
10.1109/IMTC.1998.679861
