Embedded measurement system for non-destructive testing using new eddy currents planar array probe

This paper describes the development, implementation and characterization of an embedded measurement system for non-destructive testing using a new eddy currents planar probe array. The probe has multiple, independent excitation driver traces as well as multiple sensing coils placed between the excitation traces in a matrix like configuration. The measurement system is based on a FPGA that controls which excitation traces are used and which sensitive coils are measured either in a differential or absolute configuration. FEM simulations validate the probe configuration and measurement results demonstrate the system operation.