Title :
An Efficient Static Taint-Analysis Detecting Exploitable-Points on ARM Binaries
Author :
Ki-Jin Eom ; Choong-Hyun Choi ; Joon-Young Paik ; Eun-Sun Cho
Author_Institution :
Dept. of Comput. Sci. & Eng., Chungnam Nat. Univ., Daejeon, South Korea
Abstract :
This paper aims to differentiate benign vulnerabilities from those used by cyber-attacks, based on STA (Static TaintAnalysis.) To achieve this goal, the proposed STA determines if a crash is from severe vulnerabilities, after analyzing related exploitable-points in ARM binaries. We envision that the proposed analysis would reduce the complexity of analysis, by making use of CPA (Constant Propagation Analysis) and runtime information of crash points.
Keywords :
program diagnostics; security of data; ARM binaries; CPA; STA; benign vulnerabilities; constant propagation analysis; cyber-attacks; exploitable-points detection; runtime information; static taint-analysis; Reliability; ARM binary; IDA Pro plug-in; crash point; data flow analysis; exploitable; reverse engineering; taint Analysis;
Conference_Titel :
Reliable Distributed Systems (SRDS), 2014 IEEE 33rd International Symposium on
Conference_Location :
Nara
DOI :
10.1109/SRDS.2014.66
