DocumentCode :
1871489
Title :
End-to-end predictive modeling of silicon solar cell performance: From process recipe to device simulation
Author :
Trzynadlowski, Bart C. ; Jiang, Wenjun ; Chen, Renyu ; Dunham, Scott T.
Author_Institution :
Dept. of Electr. Eng., Univ. of Washington, Seattle, WA, USA
fYear :
2011
fDate :
19-24 June 2011
Abstract :
We demonstrate the use of end-to-end predictive modeling to optimize silicon solar cell fabrication processes. Coupled continuum models for boron, phosphorus, iron, and oxygen are used to predict the distribution of electronically active defects. The models include point defect-mediated diffusion of boron and phosphorus from solid sources (e.g., POCl3) at both the emitter and back surface field. Interactions between iron and boron, boron and oxygen, and phosphorus and vacancies are modeled. From the resulting dopant and defect distributions, carrier lifetimes are computed and, along with the solar cell structure, are passed to a device simulation. We find a competing effect between lifetime-enhancing iron segregation to the boron-rich region and lifetime-degrading BO2 complex formation. Guided by modeling results, we suggest strategies to restore device performance in the presence of iron contamination and moderate oxygen concentrations, demonstrating the utility of an “end-to-end” modeling framework.
Keywords :
boron compounds; chlorine compounds; contamination; phosphorus compounds; solar cells; BO2; Fe; P; POCl3; Si; back surface field; boron; coupled continuum models; device simulation; dopant; electronically active defects distribution prediction; emitter; end-to-end modeling framework; end-to-end predictive modeling; iron contamination; lifetime-enhancing iron segregation; oxygen; oxygen concentrations; phosphorus; point defect-mediated diffusion; process recipe to device simulation; silicon solar cell fabrication processes; silicon solar cell performance; solar cell structure; solid sources; Boron; Charge carrier lifetime; Computational modeling; Iron; Performance evaluation; Semiconductor process modeling; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE
Conference_Location :
Seattle, WA
ISSN :
0160-8371
Print_ISBN :
978-1-4244-9966-3
Type :
conf
DOI :
10.1109/PVSC.2011.6186565
Filename :
6186565
Link To Document :
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