Author :
Knoblinger, G. ; Fulde, M. ; Siprak, D. ; Hodel, U. ; Von Arnim, K. ; Schulz, Th ; Pacha, C. ; Baumann, U. ; Marshall, A. ; Xiong, W. ; Cleavelin, C.R. ; Patruno, P. ; Schruefer, K.
Keywords :
MOSFET; UHF integrated circuits; field effect analogue integrated circuits; low noise amplifiers; radiofrequency integrated circuits; voltage-controlled oscillators; FinFET RF building blocks evaluation; FinFET technology; RF circuits; VCO; low noise amplifier; voltage controlled oscillators; 1f noise; CMOS technology; Circuits; Conference proceedings; FinFETs; Noise measurement; Phase noise; Radio frequency; Tuning; Voltage-controlled oscillators;