DocumentCode
187343
Title
A tool to simulate optical lithography in nanoCMOs
Author
Ferla, Tania Mara ; Flach, Guilherme ; Reis, R.
Author_Institution
Inst. de Inf. - PGMicro/PPGC, Univ. Fed. do Rio Grande do Sul (UFRGS), Porto Alegre, Brazil
fYear
2014
fDate
12-15 May 2014
Firstpage
1471
Lastpage
1474
Abstract
This paper presents the research and development of an optical simulation tool based on wavelets. The tool helps to decide the implementation of Resolution Enhancement Techniques (RET) such as Optical Proximity Correction (OPC) and double patterning. Optical lithography simulation is an essential step in a Design for Manufacturability (DFM) flow. Simulation is used in mask printability enhancement methods. Mask printability is improved by creating a modified mask for which the printed features resemble closely the features on the original mask. However lithography simulation is a compute-intensive task and a fast simulation is required to allow feasible mask correcting algorithms.
Keywords
design for manufacture; photolithography; proximity effect (lithography); DFM flow; design for manufacturability; double patterning; mask printability; nanoCMO; optical lithography; optical proximity correction; resolution enhancement techniques; Adaptive optics; Image edge detection; Integrated circuit modeling; Lithography; Optical diffraction; Optical imaging; Wavelet transforms;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference (I2MTC) Proceedings, 2014 IEEE International
Conference_Location
Montevideo
Type
conf
DOI
10.1109/I2MTC.2014.6860989
Filename
6860989
Link To Document