• DocumentCode
    187343
  • Title

    A tool to simulate optical lithography in nanoCMOs

  • Author

    Ferla, Tania Mara ; Flach, Guilherme ; Reis, R.

  • Author_Institution
    Inst. de Inf. - PGMicro/PPGC, Univ. Fed. do Rio Grande do Sul (UFRGS), Porto Alegre, Brazil
  • fYear
    2014
  • fDate
    12-15 May 2014
  • Firstpage
    1471
  • Lastpage
    1474
  • Abstract
    This paper presents the research and development of an optical simulation tool based on wavelets. The tool helps to decide the implementation of Resolution Enhancement Techniques (RET) such as Optical Proximity Correction (OPC) and double patterning. Optical lithography simulation is an essential step in a Design for Manufacturability (DFM) flow. Simulation is used in mask printability enhancement methods. Mask printability is improved by creating a modified mask for which the printed features resemble closely the features on the original mask. However lithography simulation is a compute-intensive task and a fast simulation is required to allow feasible mask correcting algorithms.
  • Keywords
    design for manufacture; photolithography; proximity effect (lithography); DFM flow; design for manufacturability; double patterning; mask printability; nanoCMO; optical lithography; optical proximity correction; resolution enhancement techniques; Adaptive optics; Image edge detection; Integrated circuit modeling; Lithography; Optical diffraction; Optical imaging; Wavelet transforms;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference (I2MTC) Proceedings, 2014 IEEE International
  • Conference_Location
    Montevideo
  • Type

    conf

  • DOI
    10.1109/I2MTC.2014.6860989
  • Filename
    6860989