Title :
Online NoC Switch Fault Detection and Diagnosis Using a High Level Fault Model
Author :
Alaghi, Armin ; Karimi, Naghmeh ; Sedghi, Mahshid ; Navabi, Zainalabedin
Author_Institution :
Univ. of Tehran, Tehran
Abstract :
This paper presents an efficient method for online testing of NoC switches. This method deals with control faults of NoC switches; i.e. the routing faults which cause NoC packets to be sent to output ports not intended to. A high level fault model has been proposed in this paper to model switch routing faults. The proposed method is evaluated by fault simulation that is based on our high-level fault model. This simulation and evaluation environment is modeled at the transaction level in VHDL.
Keywords :
fault location; network-on-chip; switches; telecommunication network routing; telecommunication switching; VHDL; network-on-chip; online NoC switch fault detection; routing faults; CMOS technology; Circuit faults; Communication switching; Fault detection; Fault diagnosis; Network-on-a-chip; Packet switching; Routing; Switches; Testing;
Conference_Titel :
Defect and Fault-Tolerance in VLSI Systems, 2007. DFT '07. 22nd IEEE International Symposium on
Conference_Location :
Rome
Print_ISBN :
978-0-7695-2885-4
DOI :
10.1109/DFT.2007.55
