• DocumentCode
    187589
  • Title

    Electrical breakdown in polymers for BEOL applications: Dielectric heating and humidity effects

  • Author

    Palit, Sarbani ; Alam, Md. Ashraful

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
  • fYear
    2014
  • fDate
    1-5 June 2014
  • Abstract
    Polymer dielectrics may be used as low-k BEOL dielectrics, however, premature electrical breakdown due to high electric fields, high frequencies and ambient humidity conditions have restricted its widespread adoption. In this study, we show that dielectric heating is the primary AC degradation mechanism in polymer dielectrics, and develop an analytical model that is consistent with measured trends in stress tests under both AC and DC electric fields. We also study the effect of exposure to ambient relative humidity on the lifetime of polymer dielectrics.
  • Keywords
    electric breakdown; electric fields; humidity; low-k dielectric thin films; polymers; AC electric fields; DC electric fields; ambient humidity conditions; analytical model; dielectric heating; electrical breakdown; humidity effects; low-k BEOL dielectrics; low-k back-end of line dielectrics; polymer dielectrics; primary AC degradation mechanism; stress tests; Dielectric measurement; Dielectrics; Electric breakdown; Electric fields; Humidity; Plastics; Stress; Dielectric breakdown; Dielectric films; Humidity control; Polymer films; Reliability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability Physics Symposium, 2014 IEEE International
  • Conference_Location
    Waikoloa, HI
  • Type

    conf

  • DOI
    10.1109/IRPS.2014.6861114
  • Filename
    6861114