DocumentCode
187589
Title
Electrical breakdown in polymers for BEOL applications: Dielectric heating and humidity effects
Author
Palit, Sarbani ; Alam, Md. Ashraful
Author_Institution
Dept. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
fYear
2014
fDate
1-5 June 2014
Abstract
Polymer dielectrics may be used as low-k BEOL dielectrics, however, premature electrical breakdown due to high electric fields, high frequencies and ambient humidity conditions have restricted its widespread adoption. In this study, we show that dielectric heating is the primary AC degradation mechanism in polymer dielectrics, and develop an analytical model that is consistent with measured trends in stress tests under both AC and DC electric fields. We also study the effect of exposure to ambient relative humidity on the lifetime of polymer dielectrics.
Keywords
electric breakdown; electric fields; humidity; low-k dielectric thin films; polymers; AC electric fields; DC electric fields; ambient humidity conditions; analytical model; dielectric heating; electrical breakdown; humidity effects; low-k BEOL dielectrics; low-k back-end of line dielectrics; polymer dielectrics; primary AC degradation mechanism; stress tests; Dielectric measurement; Dielectrics; Electric breakdown; Electric fields; Humidity; Plastics; Stress; Dielectric breakdown; Dielectric films; Humidity control; Polymer films; Reliability;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium, 2014 IEEE International
Conference_Location
Waikoloa, HI
Type
conf
DOI
10.1109/IRPS.2014.6861114
Filename
6861114
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