DocumentCode :
1876000
Title :
An EM algorithm for robust Bayesian PCA with student’s t-distribution
Author :
Gai, Jiading ; Li, Yong ; Stevenson, Robert L.
Author_Institution :
Department of Electrical Engineering, University of Notre Dame, 275 Fitzpatrick Hall, IN 46556, USA
fYear :
2008
fDate :
12-15 Oct. 2008
Firstpage :
2672
Lastpage :
2675
Abstract :
Principal component analysis (PCA) is a technique that is widely used for applications such as dimensionality reduction, image compression, feature extraction and data visualization. One of the key issues in the use of PCA for modelling is that it is very sensitive to outliers since its formulation is based on Gaussian density model. Lately, more heavy-tailed distribution (i.e., Student’s t-distribution) is introduced to increase the robustness of traditional PCA. But the robust version of PCA is expressed as the maximum likelihood solution of a probabilistic latent variable model. This reformulation raises the question of how to determine the optimal number of principal components to be retained. In this paper, we develop a Bayesian model selection approach to estimate the true dimensionality of the data. The proposed algorithm is based on a new Bayesian treatment of robust Student’s t-distribution PCA. A simple Expectation-Maximization (EM) solver is introduced to find approximate solutions for the model. Experiments show that the proposed model achieves simultaneous optimal dimensionality selection and accurate principal components recovery.
Keywords :
Algorithm design and analysis; Bayesian methods; Context modeling; Feature extraction; Gaussian distribution; Image coding; Maximum likelihood estimation; Noise robustness; Principal component analysis; Tail; EM algorithm; Robust Bayesian principal component analysis; Student’s t-distribution; evidence approximation; image modelling; subspace representation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Image Processing, 2008. ICIP 2008. 15th IEEE International Conference on
Conference_Location :
San Diego, CA, USA
ISSN :
1522-4880
Print_ISBN :
978-1-4244-1765-0
Electronic_ISBN :
1522-4880
Type :
conf
DOI :
10.1109/ICIP.2008.4712344
Filename :
4712344
Link To Document :
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