Energy control paradigm for compliance-free reliable operation of RRAM

We demonstrate reliable RRAM operation by controlling the forming energy via short voltage pulses (picosecond range) which eliminates the need for a current compliance element. We further show that the dissipated energy during forming and SET/RESET processes plays a critical role. The SET/RESET cycling endurance of thus formed devices is shown to also be dependent on the SET/RESET energy. Multiple-pulse forming is also investigated as a method to further tighten the control of forming energy with promising endurance results.