DocumentCode :
1879484
Title :
The faulty module bypass for thermoelectric generation
Author :
Qian, Wei ; Peng, Fang Z. ; Han, Sangmin
Author_Institution :
Dept. of Electr. & Comput. Eng., Michigan State Univ., East Lansing, MI, USA
fYear :
2010
fDate :
21-25 Feb. 2010
Firstpage :
2288
Lastpage :
2293
Abstract :
This paper proposes the solutions of bypassing the faulty modules for the thermoelectric generation (TEG). To obtain sufficient voltage, several TEG modules usually have to connect in series. For a single string of TEG modules, when one module fails, the output power of the whole string is lost. After comparing several low-cost bypass approaches, one bypass circuit based on the buck-boost converter is analyzed. By transferring energy among the serial modules, the terminal voltage across the serial modules can be automatically balanced. Consequently, the maximum output power can still be achieved in the remaining modules, compared to the other approaches of only bypassing the faulty module. The output power stress can be shared among the serial modules according to their output power capacity, so that the utilization of diverse cells is more effective and the lifetime of the modules is prolonged. The experimental results of a laboratory prototype demonstrate its bypass and balance features.
Keywords :
fault diagnosis; power convertors; thermoelectric conversion; TEG modules; buck-boost converter; faulty module bypass; laboratory prototype; power capacity; serial modules; terminal voltage; thermoelectric generation; Circuit faults; Diodes; Laboratories; Power generation; Prototypes; Redundancy; Stress; Temperature; Thermoelectricity; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Applied Power Electronics Conference and Exposition (APEC), 2010 Twenty-Fifth Annual IEEE
Conference_Location :
Palm Springs, CA
ISSN :
1048-2334
Print_ISBN :
978-1-4244-4782-4
Electronic_ISBN :
1048-2334
Type :
conf
DOI :
10.1109/APEC.2010.5433555
Filename :
5433555
Link To Document :
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