Experimental retrieval of the effective parameters of metamaterials using a strip line method

In this paper, a new method based on strip line structures is presented for characterization of metamaterials. The proposed method is suitable for characterization of all types of artificial structures including Single Negative (SNG) and Double Negative (DNG) media. The new method has the advantages of easy fabrication and low cost, when compared to free space or the waveguide methods. Furthermore, it has the advantage of extracting both permittivity, e, and permeability, μ, with a single measurement, when compared to microstrip line method.