DocumentCode :
1881003
Title :
XPS analysis of thermal and plasma treated polyphenylene vinylene thin films
Author :
Nguyenl, T.P. ; Amgaad, K. ; Cailler, M. ; Tran, Vi Hoa
Author_Institution :
IMN
fYear :
1994
fDate :
24-29 July 1994
Firstpage :
48
Lastpage :
48
Abstract :
Summary form only given. It is well known that the thermal or plasma treatments of the polymer films before depositing a metallic layer can appreciably enhance the adhesion property in these films. In this work, we investigated the interface formed on the polyphenylene-vinylene (PPV) thin film by depositng a thin layer of aluminium using XPS technique. Comparison of these results to those obtained in untreated sample shows that: i) thermal treatment does not modify the nature of the interface but probably affects the aluminium layer (grain size) which in turn increases the mechanical property of the interface, ii) plasma treatment (with argon, oxygen and nitrogen) has differimt effects depending on the nature of the plasma gas used. Contrary to argon which has no influence on the interface, oxygen and nitrogen treatments induce both mechanical and chemical modification of the PPV surface favoring the penetration and reaction of aluminium with the polymer.
Keywords :
Aluminum; Argon; Isotopes; Nitrogen; Paramagnetic resonance; Plasma chemistry; Plasma properties; Polymer films; Transistors; Vibrations;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Science and Technology of Synthetic Metals, 1994. ICSM '94. International Conference on
Conference_Location :
Seoul, Korea
Type :
conf
DOI :
10.1109/STSM.1994.834711
Filename :
834711
Link To Document :
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