Title :
A testset for automatic characterisation of opamps in the frequency domain
Author :
Van Grieken, Chris ; Sansen, Wiliy
Author_Institution :
Dept. of Elektrotechniek, Katholieke Univ. Leuven, Heverlee, Belgium
Abstract :
A new test set is described. It allows fully automatic measurements of the open loop gain, the common mode rejection ratio (CMRR), and the power supply rejection ratios of operational amplifiers in the frequency domain. New features include an improved method for CMRR measurement, a large frequency range (0.1 Hz to 10 MHz), and the absence of wiring to be changed by the user for the different measurements
Keywords :
frequency-domain analysis; gain measurement; integrated circuit testing; linear integrated circuits; operational amplifiers; 0.1 Hz to 10 MHz; CMRR measurement; automatic characterisation; common mode rejection ratio; frequency domain; opamps; open loop gain; power supply rejection ratios; testset; Automatic testing; Computer networks; Frequency domain analysis; Frequency measurement; Gain measurement; Impedance; Performance evaluation; Power measurement; Power supplies; Time measurement;
Conference_Titel :
Microelectronic Test Structures, 1993. ICMTS 1993. Proceedings of the 1993 International Conference on
Conference_Location :
Sitges
Print_ISBN :
0-7803-0857-3
DOI :
10.1109/ICMTS.1993.292889
