• DocumentCode
    1881968
  • Title

    Quantifying mixed uncertainties in cyber attacker payoffs

  • Author

    Chatterjee, Samrat ; Halappanavar, Mahantesh ; Tipireddy, Ramakrishna ; Oster, Matthew ; Saha, Sudip

  • Author_Institution
    Pacific Northwest Nat. Lab., Richland, WA, USA
  • fYear
    2015
  • fDate
    14-16 April 2015
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Representation and propagation of uncertainty in cyber attacker payoffs is a key aspect of security games. Past research has primarily focused on representing the defender´s beliefs about attacker payoffs as point utility estimates. More recently, within the physical security domain, attacker payoff uncertainties have been represented as Uniform and Gaussian probability distributions, and intervals. Within cyber-settings, continuous probability distributions may still be appropriate for addressing statistical (aleatory) uncertainties where the defender may assume that the attacker´s payoffs differ over time. However, systematic (epistemic) uncertainties may exist, where the defender may not have sufficient knowledge or there is insufficient information about the attacker´s payoff generation mechanism. Such epistemic uncertainties are more suitably represented as probability boxes with intervals. In this study, we explore the mathematical treatment of such mixed payoff uncertainties.
  • Keywords
    Gaussian distribution; game theory; security of data; Gaussian probability distributions; attacker payoff generation mechanism; attacker payoff uncertainties; continuous probability distributions; cyber attacker payoffs; cyber-settings; mixed payoff uncertainties; physical security domain; point utility estimates; security games; statistical uncertainties; Bayes methods; Games; Mathematical model; Probabilistic logic; Probability distribution; Security; Uncertainty; cyber security; game theory; uncertainty;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Technologies for Homeland Security (HST), 2015 IEEE International Symposium on
  • Conference_Location
    Waltham, MA
  • Print_ISBN
    978-1-4799-1736-5
  • Type

    conf

  • DOI
    10.1109/THS.2015.7225287
  • Filename
    7225287