DocumentCode :
1883757
Title :
/spl pi/-clusters in the structure of ion implanted nonconjugated polymers
Author :
Posudievsky, O.Yu. ; Mischenko, N.I.
Author_Institution :
L. V. Pisarzhevsky Institute of Physical Chemistry of the Academy of Sciences of Ukraine
fYear :
1994
fDate :
24-29 July 1994
Firstpage :
106
Lastpage :
106
Abstract :
Summary form only given. The specific properties of ion implanted nonconjugated polymers are connected with the formation of the amorphous spatial carbon network containing polycyclic clusters, i.e. /spl pi/-clusters. In the present work these clusters are studied by means of optical spectroscopy and small angle X-ray scattering. The interrelation of obtained structural data with the conductivities of the polymers is analysed. The X-ray scattering spectra of Ar/sup +/ ion implanted polyethylene and F/sup +/ ion implanted polypropylene reveal the new peak in the 4.5-6/spl deg/ range. It corresponds to the mean distance between the centers of adjacent /spl pi/-clusters equal to 2.3 nm for polyethylene and 1.9 nm for polypropylene. The optical spectra of these materials enable to calculate the mean cluster diameters turned out to be equal to 1.9 and 1.6 nm, respectively. The obtained data confirm the presence of the medium-range order /spl pi/-cluster in the structure of the implanted nonconjugated polymers. It is reasonable that F/sup +/ ions forms the clusters of smaller size as the mass of Ar /sup +/ ions is two times greater. The conductivity of implanted polypropylene is, nevertheless, one order of magnitude higher due to the greater amount of /spl pi/-clusters, that is ascertained by optical spectroscopy data, and the doping effect.
Keywords :
Amorphous materials; Argon; Conductivity; Intelligent networks; Optical polymers; Optical scattering; Particle beam optics; Polyethylene; Spectroscopy; X-ray scattering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Science and Technology of Synthetic Metals, 1994. ICSM '94. International Conference on
Conference_Location :
Seoul, Korea
Type :
conf
DOI :
10.1109/STSM.1994.834828
Filename :
834828
Link To Document :
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