• DocumentCode
    1883757
  • Title

    /spl pi/-clusters in the structure of ion implanted nonconjugated polymers

  • Author

    Posudievsky, O.Yu. ; Mischenko, N.I.

  • Author_Institution
    L. V. Pisarzhevsky Institute of Physical Chemistry of the Academy of Sciences of Ukraine
  • fYear
    1994
  • fDate
    24-29 July 1994
  • Firstpage
    106
  • Lastpage
    106
  • Abstract
    Summary form only given. The specific properties of ion implanted nonconjugated polymers are connected with the formation of the amorphous spatial carbon network containing polycyclic clusters, i.e. /spl pi/-clusters. In the present work these clusters are studied by means of optical spectroscopy and small angle X-ray scattering. The interrelation of obtained structural data with the conductivities of the polymers is analysed. The X-ray scattering spectra of Ar/sup +/ ion implanted polyethylene and F/sup +/ ion implanted polypropylene reveal the new peak in the 4.5-6/spl deg/ range. It corresponds to the mean distance between the centers of adjacent /spl pi/-clusters equal to 2.3 nm for polyethylene and 1.9 nm for polypropylene. The optical spectra of these materials enable to calculate the mean cluster diameters turned out to be equal to 1.9 and 1.6 nm, respectively. The obtained data confirm the presence of the medium-range order /spl pi/-cluster in the structure of the implanted nonconjugated polymers. It is reasonable that F/sup +/ ions forms the clusters of smaller size as the mass of Ar /sup +/ ions is two times greater. The conductivity of implanted polypropylene is, nevertheless, one order of magnitude higher due to the greater amount of /spl pi/-clusters, that is ascertained by optical spectroscopy data, and the doping effect.
  • Keywords
    Amorphous materials; Argon; Conductivity; Intelligent networks; Optical polymers; Optical scattering; Particle beam optics; Polyethylene; Spectroscopy; X-ray scattering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Science and Technology of Synthetic Metals, 1994. ICSM '94. International Conference on
  • Conference_Location
    Seoul, Korea
  • Type

    conf

  • DOI
    10.1109/STSM.1994.834828
  • Filename
    834828