Title :
A new technique for evaluating the permittivity of low loss thin film dielectric-materials-at mm-wave frequencies
Author :
Hammad, Hany F. ; Zelonka, Kim ; Freundorfer, AMs P. ; Antar, Yaiia M M ; Sayer, Mike
fDate :
March 15-17, 2005
Keywords :
Dielectric losses; Dielectric materials; Dielectric thin films; Educational institutions; Filters; Frequency; Materials science and technology; Optical computing; Permittivity; Physics computing;
Conference_Titel :
Radio Science Conference, 2005. NRSC 2005. Proceedings of the Twenty-Second National
Print_ISBN :
977-503183-4
DOI :
10.1109/NRSC.2005.194041
