An in-situ temperature-sensing interface based on a SAR ADC in 45nm LP digital CMOS for the frequency-temperature compensation of crystal oscillators

Author

Zhenning Wang ; Lin, Richard ; Gordon, Eshel ; Lakdawala, Hasnain ; Carley, L.R. ; Jensen, Jeff C.

Author_Institution

Carnegie Mellon Univ., Pittsburgh, PA, USA

fYear

2010

fDate

7-11 Feb. 2010

Firstpage

316

Lastpage

317

Abstract

A crystal-temperature-sensing interface based on an in-situ thermistor and a 1 V 12b digitally calibrated SAR ADC in 45 nm LP CMOS is presented. The digitized temperature readings are used by an LUT-based compensation scheme to stabilize the frequency of a crystal oscillator through digital capacitive load tuning to achieve Â±0.5 ppm stability over a -10-to-80Â°C temperature range.

Keywords

CMOS digital integrated circuits; analogue-digital conversion; crystal oscillators; temperature sensors; thermistors; SAR ADC; analogue-digital conversion; complementary metal-oxide-semiconductor; crystal oscillators; crystal-temperature-sensing interface; digital CMOS; digital capacitive load tuning; digitized temperature readings; frequency-temperature compensation; size 45 nm; temperature -10 C to 80 C; thermistor; voltage 1 V; Calibration; Capacitors; Clocks; Frequency; Oscillators; Sampling methods; Switches; Temperature sensors; Thermistors; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2010 IEEE International

Conference_Location

San Francisco, CA

ISSN

0193-6530

Print_ISBN

978-1-4244-6033-5

Type

conf

DOI

10.1109/ISSCC.2010.5433897

Filename

5433897