Title :
Set-level thermal management with package thermal design in digital TV application
Author :
Cho, Eun Seok ; Choi, Mi-Na ; Jung, Chung-Hyo ; Yoo, Jaewook ; Hwang, Heejung ; Lee, Heeseok ; Choi, Kiwon ; Kang, Sayoon
Author_Institution :
lPT Team (Syst. LSI), Samsung Electron. Co., Yongin
Abstract :
Thermal resistance is the most important parameter in package selection of high power devices. However, lower thermal resistances means higher package cost, so it is not easy to adopt high cost package like cavity down packages or flip-chip packages just for the thermal characteristics. Therefore, set-level thermal management and optimal thermal guide should be done before selecting thermally enhanced packages because set-level thermal management can provide us various possibilities to get proper thermal budget. Moreover, set-level thermal management can be very powerful tool in case of digital TV application because its thermal environment is apparently different from JEDEC thermal standards (JESD51). This paper will introduce simulation methodology for optimal thermal design in set- level including package selection with experimental work in digital TV applications.
Keywords :
digital television; flip-chip devices; thermal management (packaging); thermal resistance; JEDEC thermal standards; cavity down packages; digital TV application; flip-chip packages; high power devices; optimal thermal guide; package selection; package thermal design; set-level thermal management; thermal budget; thermal characteristics; thermal resistance; Costs; Digital TV; Electronic packaging thermal management; Energy management; Environmental management; Financial management; Temperature distribution; Temperature measurement; Thermal management; Thermal resistance; Ball Grid Array (BGA); Digital TV; Heat Sink; Package Thermal Design; Set-level Thermal Management (STM); Thermal Pad; Thermal Resistance;
Conference_Titel :
Thermal and Thermomechanical Phenomena in Electronic Systems, 2008. ITHERM 2008. 11th Intersociety Conference on
Conference_Location :
Orlando, FL
Print_ISBN :
978-1-4244-1700-1
Electronic_ISBN :
1087-9870
DOI :
10.1109/ITHERM.2008.4544323