• DocumentCode
    1886563
  • Title

    Effects of strain rate and aging on deformation and fracture of Sn-Ag-Cu solder joints

  • Author

    Kumar, Praveen ; Dutta, I. ; Sarihan, V. ; Frear, D.R. ; Renavikar, M.

  • Author_Institution
    Dept. of Mech. Eng., Naval Postgrad. Sch., Monterey, CA
  • fYear
    2008
  • fDate
    28-31 May 2008
  • Firstpage
    660
  • Lastpage
    667
  • Abstract
    With the proliferation of mobile electronics in everyday life, the ability of electronic packages to sustain impact loading under drop conditions has become a paramount reliability concern. Since solder joints, which serve as mechanical and electrical interconnects in a package, are particularly prone to failure during a drop, the fracture behavior of solders at high strain rates is a critically important design parameter. In the present study, tests were conducted on Sn3.5AgO.7Cu (SAC 387) alloy at various strain rates in the range of 0.1 - 100 s-1 and in various modes. Yield strength and work hardening were observed to increase substantially with strain rate. The yield strength and work hardening for aged samples were lower than as reflowed samples. Associated with the alteration of flow behavior, transitions in deformation and fracture behavior were noted. Fracture toughness (Gc) decreased with increasing strain rate, and also with increasing mode-mixity (Psi) values between 0-23deg. For low Psi, severe aging appeared to increase fracture toughness, although at higher Psi values, the distinction appeared to disappear. Correlations between joint microstructure and the observed fracture mechanism are highlighted.
  • Keywords
    ageing; copper alloys; deformation; electronics packaging; failure (mechanical); fracture toughness; reliability; silver alloys; solders; tin alloys; work hardening; yield strength; SnAgCu; aging; deformation; drop conditions; electronic packages; fracture mechanism; fracture toughness; joint microstructure; mobile electronics; mode-mixity; paramount reliability concern; solder joints; strain rate; work hardening; yield strength; Aging; Capacitive sensors; Electronics packaging; Materials reliability; Materials science and technology; Mechanical engineering; Soldering; Stress; Substrates; Testing; SnAgCu; aging; joint fracture; lead-free solder; strain rate; work hardening; yield strength;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal and Thermomechanical Phenomena in Electronic Systems, 2008. ITHERM 2008. 11th Intersociety Conference on
  • Conference_Location
    Orlando, FL
  • ISSN
    1087-9870
  • Print_ISBN
    978-1-4244-1700-1
  • Electronic_ISBN
    1087-9870
  • Type

    conf

  • DOI
    10.1109/ITHERM.2008.4544331
  • Filename
    4544331