DocumentCode :
1887755
Title :
An engineering ansatz for rescuing “waste-bin” field emission results
Author :
Forbes, Richard G.
Author_Institution :
Dept. of Electron. Eng., Univ. of Surrey, Guildford, UK
fYear :
2015
fDate :
13-17 July 2015
Firstpage :
68
Lastpage :
69
Abstract :
This conference poster presents an engineering ansatz that may be useful in situations where an orthodoxy test on the related Fowler-Nordheim plot has suggested that an extracted apparent field enhancement factor (FEF) βapp is spuriously large. The ansatz, called phenomenological adjustment, converts βapp to a smaller “ansatz-corrected” value βazc that can be presumed to be closer to the true macroscopic FEF (γC) value.
Keywords :
electron field emission; Fowler-Nordheim plot; engineering ansatz; macroscopic field enhancement factor; orthodoxy test; phenomenological adjustment; waste-bin field emission; Electron emission; Nanoelectronics; Resistance; System-on-chip; Tin; Vacuum technology; Voltage measurement; Field electron emission; Fowler-Nordheim plot analysis; field enhancement factor; phenomenological adjustment;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Nanoelectronics Conference (IVNC), 2015 28th International
Conference_Location :
Guangzhou
Print_ISBN :
978-1-4673-9356-0
Type :
conf
DOI :
10.1109/IVNC.2015.7225535
Filename :
7225535
Link To Document :
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