Title :
Digraphs and fault trees: a tale of two combinatorial modeling methods
Author :
Boyd, Mark A. ; Iverson, David L.
Author_Institution :
Div. of Inf. Sci., NASA Ames Res. Center, Moffett Field, CA, USA
Abstract :
The authors illustrate the similarities and differences of digraph and AND-OR fault tree models and discuss their use together in light of the strengths of each. A theorem is presented with proof that establishes the combinatorial modeling equivalence of digraphs and AND-OR fault trees. An integrated digraph/AND-OR fault tree modeling tool currently under development is described
Keywords :
directed graphs; failure analysis; reliability theory; AND-OR fault tree models; combinatorial modeling equivalence; digraphs; modeling tool; Control system synthesis; Control systems; Embedded system; Failure analysis; Fault tolerant systems; Fault trees; NASA; Power system modeling; Safety; Space stations;
Conference_Titel :
Reliability and Maintainability Symposium, 1993. Proceedings., Annual
Conference_Location :
Atlanta, GA
Print_ISBN :
0-7803-0943-X
DOI :
10.1109/RAMS.1993.296852
