• DocumentCode
    1891196
  • Title

    Standardize on common test hardware with a flexible switching matrix

  • Author

    Harnack, Jake ; Brice, Brandon

  • Author_Institution
    Nat. Instrum., Austin, TX, USA
  • fYear
    2013
  • fDate
    16-19 Sept. 2013
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    As product complexity continues to increase, test engineers are challenged with improving test coverage on a variety of devices while keeping costs at a minimum. When finished products incorporate hundreds or thousands of devices, developing and maintaining separate test systems for individual components lacks scalability. An approach to this problem is to standardize on a single platform and develop a small number of test systems that can each test tens or hundreds of different devices. Test engineers are increasingly seeing the benefits of developing, deploying, and supporting a reduced number of test systems that use common components. Although many factors such as system assurance and platform longevity influence the long-term success of these systems, the core requirements consist of modular, reconfigurable hardware. A switching matrix is the main hardware component that gives a single test system the flexibility to test a variety of devices. With a switching matrix, you can connect all of your instruments and test points through a series of relays and close relevant relays via software. Switching matrices provide several benefits such as simple connectivity and test repeatability; however, it´s usually not practical to have a switching matrix that completely matches the I/O of your instruments. For example, if you have a 1,000 V DMM, a 2 A power supply, and a 1.5 GHz digitizer, you´re unlikely to find a COTS switching matrix that maximizes those I/O points. Selecting a switching matrix involves evaluating various trade-offs between density, power, bandwidth, and so on and optimizing the cost of your test system. This paper examines the trade-offs you should evaluate when choosing a switching matrix along with considerations for reducing cost and size.
  • Keywords
    switching circuits; test equipment; avionics; common test hardware; connectivity; flexibility; flexible switching matrix; relays; test repeatability; test systems; Hardware; Instruments; Multiplexing; Nickel; Relays; Software; Switches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON, 2013 IEEE
  • Conference_Location
    Schaumburg, IL
  • ISSN
    1088-7725
  • Print_ISBN
    978-1-4673-5681-7
  • Type

    conf

  • DOI
    10.1109/AUTEST.2013.6645061
  • Filename
    6645061