Title :
A Dutch-US microelectronic collaboration
Author :
Van Slooten, Jesse ; Witteveen, Frank J F M ; De Gruijter, Robin ; Gunnewiek, Rene K. ; Bijker, H.J. ; Pearson, Robert E. ; Fuller, Lynn F.
Author_Institution :
Dept. of Electron., Hogesch. Enschede, Netherlands
Abstract :
The interaction between a European educational institution, i.e., the Electrical Engineering Department of the Hogeschool Enschede (HE), in the Netherlands and the Microelectronic Engineering Department of the Rochester Institute of Technology (RIT) in the US is described. Six students from the Netherlands have come to the US to complete a thesis for graduation from Hogeschool Enschede. One student conducted a six-month project on the design, simulation, fabrication, and testing of CMOS circuits. These institutions are described, together with the student´s project
Keywords :
CMOS integrated circuits; education; integrated circuit technology; project engineering; CMOS circuits; Dutch-US microelectronic collaboration; QuickSim simulation; boundary scan circuit design; education; fabrication; simulation; testing; Art; Circuit simulation; Circuit testing; Collaboration; Educational institutions; Educational programs; Educational technology; Electrical engineering; Fabrication; Microelectronics;
Conference_Titel :
University/Government/Industry Microelectronics Symposium, 1993., Proceedings of the Tenth Biennial
Conference_Location :
Research Triangle Park, NC
Print_ISBN :
0-7803-0990-1
DOI :
10.1109/UGIM.1993.297014
