Title :
Robust recursive inverse approximation and its application to parameter extraction of behavioral models
Author :
Xu, G. ; Styblinski, M.A.
Author_Institution :
Dept. of Electr. Eng., Texas A&M Univ., College Station, TX, USA
fDate :
31 May-3 Jun 1998
Abstract :
An algorithm, Robust Recursive Inverse Approximation (RRIA), for parameter extraction in the statistical IC modeling is presented. RRIA gives very accurate modeling parameter formulas based on observation data after the behavioral model is set up. It can extract the parameters simultaneously for multiple circuits which have same structure but with different parameter values. RRIA combines Newton-Raphson, least-squares and Singular Value Decomposition techniques. The theory of this algorithm is presented in detail. Its efficiency for different modeling levels is verified by two examples: the MOSFET device and the bandpass filter
Keywords :
MOSFET; Newton-Raphson method; band-pass filters; circuit analysis computing; integrated circuit modelling; least squares approximations; semiconductor device models; singular value decomposition; statistical analysis; MOSFET; Newton-Raphson method; SVD; bandpass filter; behavioral models; least-squares method; modeling parameter formulas; parameter extraction; robust recursive inverse approximation; singular value decomposition technique; statistical IC modeling; Approximation algorithms; Band pass filters; Error correction; Integrated circuit modeling; MOSFET circuits; Parameter extraction; Performance evaluation; Robustness; Space technology; Vectors;
Conference_Titel :
Circuits and Systems, 1998. ISCAS '98. Proceedings of the 1998 IEEE International Symposium on
Conference_Location :
Monterey, CA
Print_ISBN :
0-7803-4455-3
DOI :
10.1109/ISCAS.1998.705222
